Abstract:
The relationship between the frequency microstructure of the behavioral threshold and the frequency microstructure of the strength of synchronous evoked otoacoustic emissions (SEOAEs) and delayed evoked otoacoustic emissions is well documented [e.g., Zwicker and Schloth, J. Acoust. Soc. Am. 75, 1148--1154 (1984)]. In a previous report from this laboratory [Burns et al., J. Acoust. Soc. Am. Suppl. 1 80, S93 (1988)], it has been shown that there is also a correlation between the microstructure of the behavioral threshold and the microstructure of the pitch-level effect. In this paper, the relationship between changes in the microstructure of SEOAEs as a function of the level of the evoking stimulus and pitch shifts as a function of level is examined. [Work supported by NIDCD and the Virginia Merrill Bloedel Hearing Research Center.]